JEDEC JEB 15

$49.00

TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITSJEDEC Solid State Technology Association / 01-Nov-1969 / 97 pages

This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.




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This product was added to our catalog on Thursday 01 January, 1970.

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