BS EN 60749-40:2011


Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gaugeBritish-Adopted European Standard / 30-Sep-2011 / 26 pages ISBN: 9780580646294

Cross References:
IEC 60749-37
EN 60749-37

All current amendments available at time of purchase are included with the purchase of this document.

Keywords: Semiconductor devices; Integrated circuits; Electronic equipment and components; Mechanical testing; Environmental testing; Surface mounting devices; Printed-circuit boards; Drop tests; Impact testing; Accelerated testing; Strain measurement
Product Code(s): 30190357,30190357

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