BS EN 60749-38:2008


Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memoryBritish-Adopted European Standard / 30-Jun-2008 / 16 pages ISBN: 9780580548758

All current amendments available at time of purchase are included with the purchase of this document.

Keywords: Semiconductor devices; Integrated circuits; Electronic equipment and components; Mechanical testing; Environmental testing; Alpha particles ; Errors; Computer storage devices
Product Code(s): 30126445,30126445

Add to Cart:

  • Model: C6QK2Y12
  • 8888 Units in Stock

This product was added to our catalog on Thursday 01 January, 1970.

Your IP Address is:
Copyright © 2018 Buy Standards.