BS EN 60749-35:2006


Semiconductor devices. Mechanical and climatic test methods. Acoustic microscopy for plastic encapsulated electronic componentsBritish-Adopted European Standard / 30-Nov-2006 / 24 pages ISBN: 0580497399

Cross References:
IEC 60749-20
EN 60749-20:2003

Keywords: Semiconductor devices; Integrated circuits; Electronic equipment and components; Mechanical testing; Environmental testing; Climate; Ultrasonic testing; Microscopic analysis; Non-destructive testing; Encapsulated; Plastics; Packages; Test equipment
Product Code(s): 30131682,30131682

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