BS EN 60749-24:2004


Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased HASTBritish-Adopted European Standard / 24-Jun-2004 / 10 pages ISBN: 0580439720

Cross References:
IEC 60749-33
EN 60749-33:2004
IEC 60749-5
EN 60749-5:2003

Keywords: Semiconductor devices; Integrated circuits; Electronic equipment and components; Mechanical testing; Environmental testing; Climate; Solid-state physics; Moisture measurement; Damp-heat tests; Corrosion resistance; Accelerated corrosion tests; Accelerated testing; Destructive testing; Testing conditions; Humidity; Temperature; Performance testing; Reliability
Product Code(s): 30079670,30079670

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